Tabletop X-ray diffractometer (XRD) Aeris
【2021 Introduction of Transmission Measurement and Thin Film Measurement Options】 Desktop X-ray Diffraction Device (XRD)! A high-sensitivity analysis instrument capable of detecting crystal phases at concentrations below 1%.
Spectris plc's Malvern Panalytical division has launched a significantly upgraded model of the benchtop powder X-ray diffractometer, Aeris. With the expanded capabilities for thin film XRD (GIXRD) measurements, it is now possible to measure the crystallinity and residual stress of thin films and coating materials. Additionally, the enhancement of the transmittance measurement function reduces the influence of orientation during sample preparation, allowing for more accurate data even from samples like formulation materials. This renewal has enabled the incorporation of functions that were previously only available on large floor-standing systems. The new Aeris is a versatile benchtop X-ray diffractometer that can efficiently provide high-quality data from polycrystalline materials and is designed for use in all environments. Moreover, the user-friendly operability, the safe design that alleviates concerns about X-ray exposure, and the same analysis software capable of detailed analysis as the large floor-standing systems, which were well-regarded in the previous Aeris, have been thoroughly carried over in this renewal. For detailed product descriptions, measurement case studies, or requests for quotes, please feel free to contact us!
- Company：スペクトリス株式会社 マルバーン・パナリティカル事業部
- Price：Other
